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TRI SVT Module
- 产品名称：TRI SVT Module
- 产品型号：TRI SVT Module
- 产品厂商：TRI
- 产品文档：
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简单介绍
TRI SVT Module
TRI’s implementation of Intel Silicon View Technology (SVT) integrates multiple zero access technologies into a complete testing solution for devices with limited testing access.
TRI SVT Module
的详细介绍
TRI SVT Module
TRI’s implementation of Intel Silicon View Technology (SVT) integrates multiple zero access technologies into a complete testing solution for devices with limited testing access. Based on Boundary Scan with JTAG, the test probes all external ports and onboard high speed serial components, driving testing signals via BScan devices on the tested board. The SVT Module takes advantage of modern Design for Testability standards for testing designs based on Intel’s newest Haswell architecture.
FEATURES:
Bench-top or integrated ICT solution
USB 2.0 control interface
Integrated Intel XDP3 interface
Supports Intel SVT test
3 TAPs for structural test
VIH: 0.5 V – 4.5 V
VOH: 0 V – 5 V
TCK operation range: 1 kHz – 5 MHz
Built-in BScan Chain Selector and Level Shifter
Tested interfaces
High Speed Serial Interfaces: SATA, USB2.0, USB3.0, PCIe
Analog & Digital Display: VGA, HDMI, DP
Audio Test: Source/Amplitude/Frequency Measurement
KB Scan Matrix
PS/2
Ethernet LAN
GPIO
Programmable Voltage/Current Sources
Voltage 5 V – 20 V, 5 A
Battery Emulator 8 V – 12 V, 8 A
BSCAN I/O Resource (64ch, programmable 0 – 5 V)
TRI’s implementation of Intel Silicon View Technology (SVT) integrates multiple zero access technologies into a complete testing solution for devices with limited testing access. Based on Boundary Scan with JTAG, the test probes all external ports and onboard high speed serial components, driving testing signals via BScan devices on the tested board. The SVT Module takes advantage of modern Design for Testability standards for testing designs based on Intel’s newest Haswell architecture.
FEATURES:
Bench-top or integrated ICT solution
USB 2.0 control interface
Integrated Intel XDP3 interface
Supports Intel SVT test
3 TAPs for structural test
VIH: 0.5 V – 4.5 V
VOH: 0 V – 5 V
TCK operation range: 1 kHz – 5 MHz
Built-in BScan Chain Selector and Level Shifter
Tested interfaces
High Speed Serial Interfaces: SATA, USB2.0, USB3.0, PCIe
Analog & Digital Display: VGA, HDMI, DP
Audio Test: Source/Amplitude/Frequency Measurement
KB Scan Matrix
PS/2
Ethernet LAN
GPIO
Programmable Voltage/Current Sources
Voltage 5 V – 20 V, 5 A
Battery Emulator 8 V – 12 V, 8 A
BSCAN I/O Resource (64ch, programmable 0 – 5 V)