- 产品名称： In-Circuit Tester在路测试机
- 产品型号：SCORPION FiS 640 In-Circuit Tester
One powerful tester. High Fault Coverage. Easy to use.
§ Comprehensive and accurate MDA measurement and Guarding
§ Advanced automatic program generation software
§ Expandable to 1,024 pins
§ Complete fixture change in less than one minute
§ Functional power-up testing
§ BodeScan Network Analysis
§ Vectorless Test capability
§ Boundary Scan
§ Flash Programming
§ Utilize your existing fixtures
§ Small Footprint – Length: 1050mm, Width: 1050mm
§ Low cost
The Testing Power You Want
Acculogic’s Scorpion family of Automated Test Equipment (ATE) and In-circuit fixture-based testers were created with one underlining theme in mind: Cost-effective Testing. To achieve this objective, we designed a range of feature-rich testers offering:
§ Advanced automatic program generation software
§ Automatic CAD translation tools
§ High performance analog measurement system – comprehensive passive component and discrete analog device test
§ Patented vectorless opens test
§ Unique and convenient Fixture exchange system
§ Customizable Fixture Receiver to protect your fixture investments
Our systems can be configured with the following options in order to help you gain the maximum return on your investment, and to streamline your manufacturing processes:
§ Power-up Test
§ Advanced Function Test
§ Boundary Scan (JTAG) Test
§ In-System and Device Programming
Advanced automatic program generation software
Acculogic’s Integrator™ software is the comprehensive, easy-to-use graphical test generation and runtime environment for all of our Scorpion In-Circuit and Flying Probe Test Systems. This software offers Acculogic customers a highly effective and user-friendly environment for both producing and executing test programs.
The test program development process is highly automated and most of its elements can be automatically generated in minutes. Integrator™ software accepts CAD data from a variety of board design and layout sources. Integrator uses CAD data, Bill of Materials (BoM), and netlist to create a high fault coverage test program and generate the complete fixture design and fabrication information. Debug is kept to a minimum since we offer unattended Auto Debug that can debug about 95% of the program automatically. Test coverage reports are available to aid in maximizing fault coverage and for program documentation.
Limited access testing with boundary scan (JTAG) Test
Limited accessibility or lack of test access impacts a board’s test coverage. Using boundary scan technology, test coverage as well as accessibility will be improved. Acculogic offers a powerful suite of patented hardware and software tools specially designed for testing of electronic devices, boards and systems using the IEEE 1149.1 standard (and all derivatives).
In-system and device programming
Boundary Scan provides the added benefit and convenience of using the embedded resources of Micro Controllers and Processors for the programming of the embedded devices. In addition, Boundary Scan offers On-Board Programming of Flash, E2 memory devices and In-System Programming (ISP/ISC) of CPLDs, PLDs, and FPGAs.
Acculogic’s family of Boundary Scan controllers rely on the company’s patented Adaptive Clocking™ technology to provide the fastest and the most reliable means for delivering program data to the target.
Patented vectorless test
Vectorless test was pioneered in 1990 by ITA/Scorpion, (part of the Acculogic Group). It is now the preferred method to find “opens” faults around large pin count digital devices. This test method has rendered the lengthy process of test pattern development required to inspect complex VLSI parts on traditional In-Circuit testers obsolete. Acculogic’s Open Pin detection consists of two complimentary tools for the Scorpion series of testers; CScan™ and ChipScan™.
§ CScan™ – Detects open leads on ICs including BGAs, reverse electrolytic capacitors, connector pins, and decoupling capacitors
§ ChipScan™ – Detects open leads on ICs including BGAs with heat sinks
Advanced function test
Advanced Function Test expands the capabilities of the Scorpion ict beyond basic manufacturing process test.
Superior test coverage reports
The integrator software has an advanced test program coverage report generator, which provides:
§ Detailed device and pin coverage information
§ IC pin coverage data based on CScan and ChipScan test technologies
§ Enhanced coverage report based on boundary scan and ICT coverage
§ The capability to export test reports to MS Excel and TXT formats
The logical subdivision of the systems into control computer, power supply, and measurement/switching units guarantees ease of integration into any test environment.
A system configuration based on the 19”standard rack allows cost-effective incorporation into any production environment.
§ Migration from old or obsolete Automated Test Equipment/Systems has been simplified
§ Use existing fixtures from your Teradyne, GenRad or Keysight (Agilent) systems
§ Scorpion offers program translators to speed up program migration