In-Circuit Test System with Vacuum Interface

 digitaltest Sigma MTS 300V

The Sigma is multifunctional. It offers a lot of space for modules and functions, with a small footprint.

·        Up to 3,456 pins

·        Small footprint (<1m²)

·        Vacuum or cable interface available

·        Short measuring paths

·        Real parallell test with Lambda edition

Our Sigma MTS 300 has been designed for high throughput capability and with up to 1000 measurements per second it is one of the fastest in-circuit testers on the market. The test system can check your circuit boards with up to 3456 analog, 1664 hybrid or a combination of both test points. The Sigma puts flexibility, high fault coverage and simple programming at the fore.

You can use the modular test system for analog and digital in-circuit testing, vectorless testing, functional test, boundary scan and memory programming. Thanks to the non-multiplexed pin architecture it is also possible to use fixtures and test programs from other test systems.

FFeatures

Our Sigma MTS 300 has been designed for high throughput capability and with up to 1000 measurements per second it is one of the fastest in-circuit testers on the market. The test system can check your circuit boards with up to 3456 analog, 1664 hybrid or a combination of both test points. The Sigma puts flexibility, high fault coverage and simple programming at the fore.

You can use the modular test system for analog and digital in-circuit testing, vectorless testing, functional test, boundary scan and memory programming. Thanks to the non-multiplexed pin architecture it is also possible to use fixtures and test programs from other test systems.

Lambda edition: real parallel testing as the solution

Would you like to test multiple boards in parallel and save time? We have the solution: real parallel testing with the Lambda edition. With this technology you can test two or more assemblies at the same time, thereby optimizing the cycle times and shortening the test time or performing the tests using the shortest path. An ICT or functional test is performed by two or more independent test heads, reducing the test time by the corresponding factor. This applies to multi-panels as well as for multiple independent single test objects.

The Lambda edition thus reduces the test time for two objects for example by 50 percent, or 75 percent for four, and so on.

Advantages of parallel testing

·        Optimizes cycle times

·        Small, economical test heads

·        Powerful, flexible software environment

·        Assemblies can be tested without additional effort

·        Low hardware costs

·        Takes up less space

Learn more about our Lambda edition.

Features

Boundary Scan ICT

With our boundary scan upgrade for In-Circuit Tests (ICT) you can get the best of both testing methods worlds and achieve an optimal test strategy with maximum test coverage and reduced overall costs.

Learn more

CAN-/LIN-Modules

The CAN-/LIN modules are standard interfaces for communication with the test object.

Programmer Modules

With the Programmer Modules you can make specific selections for onboard flash programming. Here we integrate for example programmers from Ertec, SMH, ProMik or Algocraft.

IEEE-, RS232-, USB-Modules

These functional modules have standardized PC interfaces for communicating with additional function test modules.

PXI Devices

PXI devices serve as expansion modules for specific tests.

Optical Test Modules

The modules for optical tests can for example test LEDs, with fiber optic cables used for testing the color and intensity of LEDs.

Ideal for

·        Standard interface uses vacuum

·        Cable interface is also possible

·        Basically any interface is possible using a fixture converter (e.g. Pylon or Virginia Panel)

In order to avoid long waiting times for the construction of the fixtures, Digitaltest offers an in-house fixture service.