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High Performance In-Circuit Tester

  • 产品名称:High Performance In-Circuit Tester
  • 产品型号:Omega MTS 888
  • 产品厂商:digitaltest
  • 产品文档:
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简单介绍
High Performance In-Circuit Tester Omega MTS 888 The Omega is our high performance tester, which offers the highest number of test pins. • Up to 7,040 pins • Swiveling interface for ergonomic Operation • Pneumatic fixture lowering

High Performance In-Circuit Tester

的详细介绍

Description:

Our highly ergonomic Omega MTS 888 offers not only a healthy workstation but also an extremely high-performance test system with 7040 test pins. Here we have developed a height-adjustable and tiltable high-performance tester that allows you to construct the fixture even while the test program is being developed.

Since each channel can be assigned to its own logic family, fixture construction is made much simpler. The in-circuit tester can also be configured as a functional tester. Here simply use our various modules, such as the frequency-time measuring unit, analog in-/output, or voltage sources.

Features

Maximum no. of networks

7040

Maximum board size (mm)

Unlimited

Interface

Vacuum or cable

System size (LxWxD)

1500 x 860 up to 1060 (adjustable) x 750

Format

High pin count, high-performance tester, ergonomic

Possible versions

analog, hybrid & Lambda edition

Maximum fixture pin number

7040

 

Lambda edition: real parallel testing as the solution

Would you like to test multiple boards in parallel and save time? We have the solution: real parallel testing with the Lambda edition. With this technology you can test two or more assemblies at the same time, thereby optimizing the cycle times and shortening the test time or performing the tests using the shortest path. An ict or functional test is performed by two or more independent test heads, reducing the test time by the corresponding factor. This applies to multi-panels as well as for multiple independent single test objects.

The Lambda edition thus reduces the test time for two objects for example by 50 percent, or 75 percent for four, and so on.

Advantages of parallel testing

·        Optimizes cycle times

·        Small, economical test heads

·        Powerful, flexible software environment

·        Assemblies can be tested without additional effort

·        Low hardware costs

·        Takes up less space

Boundary Scan ICT

With our boundary scan upgrade for In-Circuit Tests (ICT) you can get the best of both testing methods worlds and achieve an optimal test strategy with maximum test coverage and reduced overall costs.

Learn more

CAN-/LIN-Modules

The CAN-/LIN modules are standard interfaces for communication with the test object.

Programmer Modules

With the Programmer Modules you can make specific selections for onboard flash programming. Here we integrate for example programmers from Ertec, SMH, ProMik or Algocraft.

IEEE-, RS232-, USB-Modules

These functional modules have standardized PC interfaces for communicating with additional function test modules.

PXI Devices 

PXI devices serve as expansion modules for specific tests.

Optical Test Modules

The modules for optical tests can for example test LEDs, with fiber optic cables used for testing the color and intensity of LEDs.

 

AMU05